|
|
|
The iTEM Solution Diffraction is the extension level for digital electron diffraction pattern analysis which provides important information on the microstructure of crystalline materials.
|
|
|
 |
Automatically analyzing and indexing of digital electron diffraction pattern
|
|
Determination of reciprocal units
|
|
Readout of camera length directly
|
|
|
|
| Add-in |
Description |
| Calibration |
Automatic: when using remote-capable TEMs, diffraction patterns are calibrated immediately following acquisition
Automatic or manual determination of central spot position |
| Indexing |
Automatic: via threshold detection
Manual: by defining g vectors
Single crystalline and polycrystalline materials are supported
Calculation and display of zone axes
Lattice plane distances shown in sheets following indexing |
| Measurements |
Distances between lattice planes
Angles between lattice planes
The integrated snap function (which can be switched on and off) ensures the greatest possible precision when locating the brightest ambient point
Edit, delete and add measurements
Online statistics
Show measurement results in sheets and graphically
Automatic filtering
Export to MS Excel |
|
|
|
|
|
|
|
Top
Print Page