Upgrade analog SEM
Improvement of dynamic range
Improvement of pixel resolution
Digital Documentation
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Key Features Specifications Applications
Function Name Description
Scan Control Active scan
Passive scan
Conducting external scan signals
Simultaneous acquisition of up to 16 EDX TTL (32-bit, 8-MHz) signals
Imaging Line scan
Mapping
Point
Qualitative and quantitative with EDS/WDS (Solution "X-Ray")
Frame averaging 
Running averaging
Focus window with pre-magnification for focusing (20x)
Auto brightness/contrast
Live histogram, live intensity profile (Line scan)
Scan output range Scan output: +- 10 V
External synchronization Mains sync
Line sync or frame sync for passive scan
Image options Up to 4 image signals with 14 bit digitalization, simultaneous acquisition
16 counters
Aspect options 4:3, 3:4, square. Pixels are always square
Image size Maximum 12k x 12k
Bit depth 14 bit, save as 16 bit TIFF
Pixel time Min pixel time: 20 nsec
Max pixel time: 2 sec
Frame rate 15 frames (600x600), depending of SEM
Analog input range Scan input: +- 5 V
Noise rejection Oversampling: up to 130 millions
Analog gain control Separately adjustable for each input channel
Pulse signal inputs Trigger inputs and outputs (TTL)
Image calibration Calibration for different magnifications
Display options Auto brightness
Contrast
Manual contrast/brightness
Live pseudo color
Power supply 15 Watt
Data transfer  FireWire (IEEE 1394)
Software Scandium, SEM Imaging Platform by Olympus Soft Imaging Solutions
iTEM, TEM Imaging Platform by Olympus Soft Imaging Solutions
Compatibility PC using Windows XP (SP2)
Weight / Size 324 x 268 x 55 mm
 





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Scandium Solution X-Ray

Automatically examination of quantified and combined morphological and chemical information.

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