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The Scandium Solution Detection offers comprehensive particle analysis functions.
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Morphological filtering
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Particle separation tools
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Multi-phase particle detection
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Particle classification
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Regions Of Interest
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Fourier filtering (FFT)
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| Add-in |
Description |
| Particle analysis |
Fully automated particle analysis
Easy-to-use particle separation
Multiphase particle analysis
Multiphase analysis
Detection and classification
Particle, class and frame/ROI measurements
User-defined particle parameters
Particle classification
Automatic filtering
Extensive statistical functions
Data displayed in sheets and/or diagrams
Particles linked to respective sheet entries
Connect particle parameters logically |
| Morphological filters |
Erosion, Dilation, Open, Close, Top Hat, Skeleton, etc |
| fft |
Different filter types / modes
Different filter sizes
8 /16 bit images for input and output
Regions of interest
No data loss after transformation and inverse transformation
Fast computing
Convolution
Cross correlation |
| Imaging C |
Programming language with macro recording, interpreter and compiler
Scripting of named arguments
Integrated MDI editor and command window
Integrated debugger
Function and symbol browser
Comprehensive function and object library |
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ADDA3 - SEM / STEM Scan Interface
Upgrade your old analog or digital scanning electron microscope to a modern high performance device.
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