The Scandium Solution Height is for generating and measuring height information.



Height reconstruction of tilted images
Measuring height information
Extended Focal Imaging (EFI)
Roughness measurements
Visualization of 3-D information
Back to product overview
Key Features Specifications Applications
The Scandium Solution Height offers tools for generating and measuring height information.

stereo
Stereo is for quantitative height reconstruction based on stereo image pairs. Results are available as height differences, height profiles or as a 3-D surface. Roughness parameters of the reconstructed surface may also be calculated (s. description of "roughness"). Exporting to sheets is also available. Display a correlation map for quality control purposes. Precision may be improved via sub-pixel interpolation. Stereo image pairs and height map can be saved and archived together as an image stack.

efi (extended focal imaging)
efi acquires images at different focal positions and extracts the sharpest detail from each image respectively. efi takes all component images and combines them to create one, very sharp image with infinite depth of focus. efi supports automatic montage of color and b/w image series. efi will also generate height maps from the component images.

roughness
Roughness is an add-in for non-contact measurement of roughness and waviness based on topographical images. Roughness standards according to DIN, ISO and ASTM are supported. The following are supported: measurement of practically all height parameters (Ra, Rz, Ry,...), calculation of waviness and the detailed evaluation of material composition curves (core roughness depth,... ). In addition, all profiles can be shown (measurement profiles, roughness, waviness). Filter characteristics can be specified as defined by the user or according to DIN, ISO, ASTM.

Imaging C
Imaging C provides users with the C programming language and high-performance image-processing libraries containing more than 8000 commands. Windows API commands and commands from external DLLs are supported. This software extension includes a compiler and a debugger. Programs created using imaging C can be run as add-ins in Scandium.

Required Accessories:

  • Scandium Software

Customer Care
Scandium Solution Height
  Brochures
Application Notes
Contact Us



ADDA3 - SEM / STEM Scan Interface
Upgrade your old analog or digital scanning electron microscope to a modern high performance device.
Details




Top