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The Scandium Solution X-Ray combines several tools for dealing with microanalysis systems. Quantified and combined morphological and chemical information are examined automatically.
Pascal (Particle Scan and Analysis)
Pascal is an add-in for controlling EDS x-ray analysis devices. Via the EDS system it captures both electron images and x-ray spectra. The position of the electron beam can be determined interactively on the image. Used in conjunction with the Scandium Solution Detection the coordinates of the detected particles may be used as positions for the spectral acquisitions. The acquired spectra are transmitted and may be either stored in the database or also inserted into a report. Pascal initiates spectral quantification and then combines this with the morphological data from the x-ray analysis.
ADDA EDS
Counter for the impulses generated by an EDS or WDS system. When used in conjunction with an active ADDA II Slowscan interface for active image acquisition of scanning microscopes (SEM, STEM), four counters may be used simultaneously with the ADDA EDS. Count rates are displayed as a false-color element map.
KLM Marker
Using the KLM Marker, individual peaks of the EDS spectrum can be automatically or manually assigned to the corresponding chemical element.
Imaging C
Imaging C provides users with the C programming language and high-performance image-processing libraries containing more than 8000 commands. Windows API commands and commands from external DLLs are supported. This software extension includes a compiler and a debugger. Programs created using imaging C can be run as add-ins in Scandium.
Required Accessories:
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